Pāriet uz galveno navigāciju Pāriet uz meklēšanu Pāriet uz galveno saturu

Sensitivity of extended X-ray-absorption fine structure to thermal expansion

  • G. Dalba
  • , P. Fornasini
  • , R. Grisenti
  • , J. Purans
  • University of Trento
  • National Research Council of Italy

Zinātniskās darbības rezultāts: Devums žurnālamZinātniskais raksts (žurnālā)koleģiāli recenzēts

159 Atsauces (Scopus)

Kopsavilkums

The sensitivity of extended x-ray-absorption fine structure (EXAFS) to thermal expansion has been studied by temperature-dependent measurements on germanium. The first cumulant does not reproduce the thermal expansion owing to vibrations normal to the bond. The perpendicular relative displacement ⟨Δu21⟩ has been for the first time experimentally obtained; the ratio ⟨Δu21⟩/⟨Δu2|is in agreement with vibrational model calculations. Low-temperature quantum effects on the 3rd cumulant have been for the first time observed. The possibility of measuring thermal expansion from the 3rd cumulant is demonstrated, provided that quantum effects are taken into account.

OriģinālvalodaAngļu
Lapas (no-līdz)4240-4243
Lapu skaits4
ŽurnālsPhysical Review Letters
Sējums82
Izdevuma numurs21
DOIs
Publikācijas statussPublicēts - 1999

Nospiedums

Uzziniet vairāk par pētniecības tēmām “Sensitivity of extended X-ray-absorption fine structure to thermal expansion”. Kopā tie veido unikālu nospiedumu.

Citēt šo