Structural and optical characterization of Ba0.8Sr0.2TiO3 PLD deposited films

I. Aulika; J. Pokorny; V. Zauls; K. Kundzins; M. Rutkis; J. Petzelt

doi:10.1016/j.optmat.2007.05.004

Structural and optical characterization of Ba_0.8Sr_0.2TiO₃ PLD deposited films

I. Aulika^*
, J. Pokorny
, V. Zauls
, K. Kundzins
, M. Rutkis
, J. Petzelt

^*Šī darba korespondējošais autors

Czech Academy of Sciences

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

15 Atsauces (Scopus)

Kopsavilkums

Structural and optical properties of Ba_0.8Sr_0.2TiO₃(BST) ferroelectric thin films, deposited by the pulsed laser ablation (PLD) technique on Si/SiO₂/Ti/Pt, Si/SrRuO₃ and Si substrates, were performed by X-ray diffraction, micro Raman, atomic force microscopy (AFM), and optical reflectometry measurements. Temperature dependences of the Raman spectrum, and room temperature refractive and extinction indices, and surface roughness were evaluated.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	1017-1022
Lapu skaits	6
Žurnāls	Optical Materials
Sējums	30
Izdevuma numurs	7
DOIs	https://doi.org/10.1016/j.optmat.2007.05.004
Publikācijas statuss	Publicēts - marts 2008

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10.1016/j.optmat.2007.05.004

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title = "Structural and optical characterization of Ba0.8Sr0.2TiO3 PLD deposited films",

abstract = "Structural and optical properties of Ba0.8Sr0.2TiO3(BST) ferroelectric thin films, deposited by the pulsed laser ablation (PLD) technique on Si/SiO2/Ti/Pt, Si/SrRuO3 and Si substrates, were performed by X-ray diffraction, micro Raman, atomic force microscopy (AFM), and optical reflectometry measurements. Temperature dependences of the Raman spectrum, and room temperature refractive and extinction indices, and surface roughness were evaluated.",

keywords = "Ferroelectric, Internal stress, Optical properties, Raman scattering, Structure, Thin films",

author = "I. Aulika and J. Pokorny and V. Zauls and K. Kundzins and M. Rutkis and J. Petzelt",

year = "2008",

month = mar,

doi = "10.1016/j.optmat.2007.05.004",

language = "English",

volume = "30",

pages = "1017--1022",

journal = "Optical Materials",

issn = "0925-3467",

publisher = "Elsevier B.V.",

number = "7",

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TY - JOUR

T1 - Structural and optical characterization of Ba0.8Sr0.2TiO3 PLD deposited films

AU - Aulika, I.

AU - Pokorny, J.

AU - Zauls, V.

AU - Kundzins, K.

AU - Rutkis, M.

AU - Petzelt, J.

PY - 2008/3

Y1 - 2008/3

N2 - Structural and optical properties of Ba0.8Sr0.2TiO3(BST) ferroelectric thin films, deposited by the pulsed laser ablation (PLD) technique on Si/SiO2/Ti/Pt, Si/SrRuO3 and Si substrates, were performed by X-ray diffraction, micro Raman, atomic force microscopy (AFM), and optical reflectometry measurements. Temperature dependences of the Raman spectrum, and room temperature refractive and extinction indices, and surface roughness were evaluated.

AB - Structural and optical properties of Ba0.8Sr0.2TiO3(BST) ferroelectric thin films, deposited by the pulsed laser ablation (PLD) technique on Si/SiO2/Ti/Pt, Si/SrRuO3 and Si substrates, were performed by X-ray diffraction, micro Raman, atomic force microscopy (AFM), and optical reflectometry measurements. Temperature dependences of the Raman spectrum, and room temperature refractive and extinction indices, and surface roughness were evaluated.

KW - Ferroelectric

KW - Internal stress

KW - Optical properties

KW - Raman scattering

KW - Structure

KW - Thin films

UR - https://www.scopus.com/pages/publications/39449106744

U2 - 10.1016/j.optmat.2007.05.004

DO - 10.1016/j.optmat.2007.05.004

M3 - Article

AN - SCOPUS:39449106744

SN - 0925-3467

VL - 30

SP - 1017

EP - 1022

JO - Optical Materials

JF - Optical Materials

IS - 7

ER -