X-ray absorption spectroscopy of Cu-doped WO3 films for use in electrochemical metallization cell memory

A. Kuzmin; A. Anspoks; A. Kalinko; J. Timoshenko; R. Kalendarev

doi:10.1016/j.jnoncrysol.2014.01.022

X-ray absorption spectroscopy of Cu-doped WO₃ films for use in electrochemical metallization cell memory

A. Kuzmin^*
, A. Anspoks
, A. Kalinko
, J. Timoshenko
, R. Kalendarev

^*Šī darba korespondējošais autors

EXAFS spektroskopijas laboratorija, Cietvielu fizikas institūts

Pētījuma izpildes rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

12 Atsauces (Scopus)

Kopsavilkums

We have performed the first synchrotron radiation X-ray absorption spectroscopy (EXAFS/XANES) study of the local atomic and electronic structure around Cu and W ions in WO₃/Cu/WO₃/Si and WO ₃/Cu/Si multilayered structures, aimed for the application in the electrochemical metallization cell memory. The influence of low-temperature annealing at 135 °C has been investigated in details, and a structural model of Cu-doped WO₃ films is proposed.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	87-91
Lapu skaits	5
Žurnāls	Journal of Non-Crystalline Solids
Sējums	401
DOIs	https://doi.org/10.1016/j.jnoncrysol.2014.01.022
Publikācijas statuss	Publicēts - 1 okt. 2014

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10.1016/j.jnoncrysol.2014.01.022

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title = "X-ray absorption spectroscopy of Cu-doped WO3 films for use in electrochemical metallization cell memory",

abstract = "We have performed the first synchrotron radiation X-ray absorption spectroscopy (EXAFS/XANES) study of the local atomic and electronic structure around Cu and W ions in WO3/Cu/WO3/Si and WO 3/Cu/Si multilayered structures, aimed for the application in the electrochemical metallization cell memory. The influence of low-temperature annealing at 135 °C has been investigated in details, and a structural model of Cu-doped WO3 films is proposed.",

keywords = "Electrochemical metallization cell, EXAFS, Thin films, XANES",

author = "A. Kuzmin and A. Anspoks and A. Kalinko and J. Timoshenko and R. Kalendarev",

year = "2014",

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doi = "10.1016/j.jnoncrysol.2014.01.022",

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TY - JOUR

T1 - X-ray absorption spectroscopy of Cu-doped WO3 films for use in electrochemical metallization cell memory

AU - Kuzmin, A.

AU - Anspoks, A.

AU - Kalinko, A.

AU - Timoshenko, J.

AU - Kalendarev, R.

PY - 2014/10/1

Y1 - 2014/10/1

N2 - We have performed the first synchrotron radiation X-ray absorption spectroscopy (EXAFS/XANES) study of the local atomic and electronic structure around Cu and W ions in WO3/Cu/WO3/Si and WO 3/Cu/Si multilayered structures, aimed for the application in the electrochemical metallization cell memory. The influence of low-temperature annealing at 135 °C has been investigated in details, and a structural model of Cu-doped WO3 films is proposed.

AB - We have performed the first synchrotron radiation X-ray absorption spectroscopy (EXAFS/XANES) study of the local atomic and electronic structure around Cu and W ions in WO3/Cu/WO3/Si and WO 3/Cu/Si multilayered structures, aimed for the application in the electrochemical metallization cell memory. The influence of low-temperature annealing at 135 °C has been investigated in details, and a structural model of Cu-doped WO3 films is proposed.

KW - Electrochemical metallization cell

KW - EXAFS

KW - Thin films

KW - XANES

UR - https://www.scopus.com/pages/publications/84905703213

U2 - 10.1016/j.jnoncrysol.2014.01.022

DO - 10.1016/j.jnoncrysol.2014.01.022

M3 - Article

AN - SCOPUS:84905703213

SN - 0022-3093

VL - 401

SP - 87

EP - 91

JO - Journal of Non-Crystalline Solids

JF - Journal of Non-Crystalline Solids

ER -