X-ray characterization and domain structure of high-quality SrBi ₂Ta₂O₉ single-crystals grown by self-flux solution method

High-quality SrBi₂Ta₂O₉ single crystals were grown by self-flux solution method. According to x-ray topography the crystals with layered habitus and typical dimensions up to ∼7 × 5 × 0.05 mm³ show perfect (001)-orientation with the edges directed along [110] axes. The quality of the crystals was also confirmed by high-field measurements, which did not detect any ferroelectric hysteresis along the c-axis crystallographic direction thus confirming that the polarization vector lies entirely in the a-b plane. Sharp phase transition (T_c = 350°C) with well-defined Curie-Weiss behavior above the transition was found. Examination of the domain structure revealed well-faceted 90° domains forming due to mechanical twinning above the transition to ferroelectric phase.